The nucleation and early stages of layer-by-layer growth of metal organic frameworks on surfaces
Description
High resolution atomic force microscopy (AFM) is used to resolve the evolution of crystallites of a metal organic framework (HKUST-1) grown on Au(111) using a liquid-phase layer-by-layer methodology. The nucleation and faceting of individual crystallites is followed by repeatedly imaging the same sub-micron region after each cycle of growth and we find that the growing surface is terminated by {111} facets leading to the formation of pyramidal nanostructures for [100] oriented crystallites, and triangular [111] islands with typical lateral dimensions of 10s of nanometres. AFM images reveal that crystallites can grow by 5-10 layers in each cycle. The growth rate depends on crystallographic orientation and the morphology of the gold substrate, and we demonstrate that under these conditions the growth is nanocrystalline with a morphology determined by the minimum energy surface.
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Subjects
- Nanocrystals
- Atomic force microscopy
- Nucleation
- Supramolecular organometallic chemistry
- Crystallography
- Surfaces
- Nanostructures
- Crystal growth
- Metal organic frameworks, SURMOFs, atomic force microscopy, HKUST
- JACS Subjects::Physical sciences::Chemistry::Physical chemistry
- JACS Subjects::Physical sciences::Physics::Chemical physics, Solid-state physics
- Library of Congress Subject Areas::Q Science::QC Physics::QC170 Atomic physics. Constitution and properties of matter
- Library of Congress Subject Areas::Q Science::QD Chemistry::QD450 Physical and theoretical chemistry
Divisions
- Faculties, Schools and Departments::University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy
Deposit date
2015-09-15Data type
Images acquired using atomic force microscopyContributors
- Summerfield, Alex
- Cebula, Izabela
- Schröder, Martin
Funders
- Funders::Engineering & Physical Sciences Research Council
Grant number
- EP/I011870/1
Collection dates
- June 2013 - June 2014
Data collection method
Atomic force microscopyResource languages
- en
Copyright
- University of Nottingham