3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling

Thumbnail
View/Open
Publication date
2016-09-20
Creators
Taylor, Michael
Metadata
Show full item record
Description
Data storage of 3 ToF-SIMS depth profiles of frozen-hydrated hydrogels as required by the EPSRC data deposit requirement
External URI
DOI
Related publication DOI
Subjects
  • Time-of-flight mass spectrometry
  • Ion mobility spectroscopy
  • Colloids
  • Pharmaceutical chemistry -- Analysis
  • Hydrogel, ToF-SIMS, Frozen
  • Physical sciences::Materials science
  • Q Science::QD Chemistry::QD 71 Analytical chemistry
Divisions
  • University of Nottingham, UK Campus::Faculty of Science::School of Pharmacy
Research institutes and centres
  • University of Nottingham, UK Campus::Biophysics, Imaging and Optical Science, Institute of
Deposit date
2016-09-20
Alternative title
  • ToF-SIMS of hydrogels
Data type
Text files, text files for depth profiles
Contributors
  • Zelzer, Mischa
  • Buttery, Lee
  • Scurr, David
  • Alexander, Morgan
Funders
  • Engineering & Physical Sciences Research Council
Grant number
  • EPF500491/1
Collection dates
  • 15/08/15
Data collection method
ToF-SIMS
Resource languages
  • en
Copyright
  • The University of Nottingham
Publisher
University of Nottingham