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dc.contributor.authorTaylor, Michael
dc.contributor.otherZelzer, Mischa
dc.contributor.otherButtery, Lee
dc.contributor.otherScurr, David
dc.contributor.otherAlexander, Morgan
dc.date.accessioned2016-09-20T11:58:35Z
dc.date.available2016-09-20T11:58:35Z
dc.date.issued2016-09-20
dc.identifier.urihttps://rdmc.nottingham.ac.uk/handle/internal/61
dc.description.abstractData storage of 3 ToF-SIMS depth profiles of frozen-hydrated hydrogels as required by the EPSRC data deposit requirementen_UK
dc.language.isoenen_UK
dc.publisherUniversity of Nottinghamen_UK
dc.subject.lcshTime-of-flight mass spectrometryen_UK
dc.subject.lcshIon mobility spectroscopyen_UK
dc.subject.lcshColloidsen_UK
dc.subject.lcshPharmaceutical chemistry -- Analysisen_UK
dc.title3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profilingen_UK
dc.title.alternativeToF-SIMS of hydrogelsen_UK
dc.typedataset
dc.identifier.doihttp://doi.org/10.17639/nott.58
dc.subject.freeHydrogel, ToF-SIMS, Frozenen_UK
dc.subject.jacsPhysical sciences::Materials scienceen_UK
dc.subject.lcQ Science::QD Chemistry::QD 71 Analytical chemistryen_UK
dc.date.collection15/08/15en_UK
uon.divisionUniversity of Nottingham, UK Campus::Faculty of Science::School of Pharmacyen_UK
uon.funder.controlledEngineering & Physical Sciences Research Councilen_UK
uon.datatypeText files, text files for depth profilesen_UK
uon.grantEPF500491/1en_UK
uon.collectionmethodToF-SIMSen_UK
uon.rightscontactThe University of Nottinghamen_UK
uon.institutes-centresUniversity of Nottingham, UK Campus::Biophysics, Imaging and Optical Science, Institute ofen_UK
uon.preservation.rarelyaccessedtrue
dc.relation.doi10.1116/1.4928209en_UK


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