Automated extraction of single H atoms with STM: tip state dependency
| dc.contributor.author | Møller, Morten | |
| dc.contributor.other | Jarvis, Samuel P. | |
| dc.contributor.other | Guérinet, Laurent | |
| dc.contributor.other | Sharp, Peter | |
| dc.contributor.other | Woolley, Richard | |
| dc.contributor.other | Rahe, Philipp | |
| dc.contributor.other | Moriarty, Philip | |
| dc.date.accessioned | 2016-11-14T02:39:21Z | |
| dc.date.available | 2016-11-14T02:39:21Z | |
| dc.date.issued | 2016-11-11 | |
| dc.identifier.uri | https://rdmc.nottingham.ac.uk/handle/internal/70 | |
| dc.description.abstract | Raw data files used for and extraction routine. In this study an automated extraction routine is used to extract (desorb) single H atoms from H:Si(100)-2 x 1 surfaces with single atom specificity. The tip state influence on the desorption process is examined using a large set of experimental runs of the extraction routine. | en_UK |
| dc.language.iso | en | en_UK |
| dc.publisher | The University of Nottingham | en_UK |
| dc.subject.lcsh | Scanning tunneling microscopy | en_UK |
| dc.subject.lcsh | Atoms -- Research | en_UK |
| dc.title | Automated extraction of single H atoms with STM: tip state dependency | en_UK |
| dc.type | dataset | |
| dc.identifier.doi | http://doi.org/10.17639/nott.67 | |
| dc.subject.free | Scanning Tunneling Microscopy (STM) Atomic Manipulation | en_UK |
| dc.subject.jacs | Physical sciences::Physics::Chemical physics, Solid-state physics | en_UK |
| dc.subject.lc | Q Science::QC Physics::QC170 Atomic physics. Constitution and properties of matter | en_UK |
| dc.date.collection | 2015-09-23 - 2015-11-05 | en_UK |
| uon.division | University of Nottingham, UK Campus::Faculty of Science::School of Physics and Astronomy | en_UK |
| uon.funder.controlled | Engineering & Physical Sciences Research Council | en_UK |
| uon.datatype | Scanning probe microscopy images (STM) and automation code | en_UK |
| uon.funder.free | European Union | en_UK |
| uon.funder.free | Leverhulme Trust | en_UK |
| uon.grant | EP/G007837/1 | en_UK |
| uon.grant | FP7 ICTFET | en_UK |
| uon.grant | EP/J500483/1 | en_UK |
| uon.grant | ECF-2015-005 | en_UK |
| uon.collectionmethod | Omicron VT STM/AFM system | en_UK |
| uon.preservation.rarelyaccessed | true |
